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ADE UltraGage 9500

Equipment: ADE UltraGage 9500
Manufacturer: ADE Equipment
Description:

 Measures thickness, shape stress, global and site flatness.


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ADE 8100 Microscan

Equipment: ADE 8100 Microscan
Manufacturer: ADE Equipment
Description:

 Measures wafer thickness, bow, warp, site flatness, and global flatness.


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ADE UltraScan 9300 Wafer Inspection System

Equipment: ADE UltraScan 9300 Wafer Inspection System
Manufacturer: ADE Equipment
Description:

Non-contact capacitive probe measurement with 10nm resolution, and 400 to 1000 microns wafer thickness range. It is capable of handling 100mm to 200mm wafers.


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ADE UltraScan 9350 Wafer Inspection / Sorter System

Equipment: ADE UltraScan 9350 Wafer Inspection / Sorter System
Manufacturer: ADE Equipment
Description:

Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers


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