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Category   >> Metrology - Test & Inspection System   >> Estek Wis 600 Inspection System Wafer Surface Analysis System
Estek Wis 600 Inspection System Wafer Surface Analysis System

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408-654-9500
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Wafer Surface Analysis System Light and dark channel, Capability 3" to 6" wafers.

Self diagnostics to reduce maintenance downtime.

Flexible software that allows the engineer to tailor programs for specific applications.

 
 

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